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This document discusses the techniques and applications of X-ray diffraction (XRD) in material analysis. It outlines three main XRD techniques: high, medium, and low resolution. High resolution is mostly used for near-perfect single crystals, medium for textured films, and low for polycrystalline materials. Some applications discussed include phase analysis using ω-2θ scans, determining lattice constants through indexing, measuring thickness with rocking curves, and analyzing composition and defects with re

Author

Lương Hữu Bắc

Language

EN