About this scholarly article

2012 2nd International Conference on Consumer Electronics, Communications and Networks (CECNet) - BIST using Cellular Automata as test pattern generator and response compaction by Gao, Lixin; Zhang, Yongliang; Zhao, Jinhong is a scholarly article available to read on EtoBox.

Author

Gao, Lixin; Zhang, Yongliang; Zhao, Jinhong

Publisher

IEEE

Published

2012

Language

EN