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About this Engineering article
Wear of ultrathin carbon overcoat characterized by microwear scan and Auger electron spectroscopy by Wu, Tsai-Wei; Deline, Vaughn; Scharf, Thomas W.; Yen, Bing K.; Barnard, John A. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Wu, Tsai-Wei; Deline, Vaughn; Scharf, Thomas W.; Yen, Bing K.; Barnard, John A.
- Publisher
- AVS (American Vacuum Society); American Vacuum Society; American Institute of Physics (ISSN 0734-2101)
- Published
- 2001
- Language
- EN
- Field
- Engineering (Physical Sciences)
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