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Slow mode degradation mechanism of ZnSe based white LEDs by Masahiro Adachi; Koshi Ando; Tomoki Abe; Sueyuki Tsutsumi; Noboru Inoue; Hirofumi Kasada; Koji Katayama; Takao Nakamura is a Physics and Astronomy article available to read on EtoBox.

What is Slow mode degradation mechanism of ZnSe based white LEDs about?

## Abstract This paper presents slow mode degradation mechanism of ZnSe‐based white LEDs, which is induced by point defect. The white LEDs are very high quality devices, of which the optical power at a forward current of 20 mA is 8.3mWand the luminous efficiency is 28 lm/W, which is comparable to GaN‐based white LEDs in the market. It is proven that microscopic point defects in the devices, detected as deep hole traps of the H1 center (E~v~ + 0.6 eV) and H0 center (E~v~ + 0.8 eV) in p‐type ZnMgSSe cladding layer, are responsible for the slow‐mode degradation. These point defects, related to nitrogen complex centers, are very electrically active under device operation. An important insight of the H0 center are found that the mobility of the defect is extremely high, and then it induces marked interaction with macroscopic defects. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

Who reads Slow mode degradation mechanism of ZnSe based white LEDs?

Author

Masahiro Adachi; Koshi Ando; Tomoki Abe; Sueyuki Tsutsumi; Noboru Inoue; Hirofumi Kasada; Koji Katayama; Takao Nakamura

Publisher

John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Ltd.; Wiley (ISSN 0370-1972)

Published

2004

Language

EN

Field

Physics and Astronomy (Physical Sciences)