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Defect and fault tolerance in VLSI systems : volume 2 : proceedings of the International Workshop on Defect and Fault Tolerance in VLSI Systems, held October 22-24, 1989, in Tampa, Florida by C. H. Stapper (auth.), C. H. Stapper, V. K. Jain, G. Saucier (eds.) is a engineering available to read on EtoBox.

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Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance

Who reads Defect and fault tolerance in VLSI systems : volume 2 : proceedings of the International Workshop on Defect and Fault Tolerance in VLSI Systems, held October 22-24, 1989, in Tampa, Florida?

Author

C. H. Stapper (auth.), C. H. Stapper, V. K. Jain, G. Saucier (eds.)

Publisher

Springer US : Imprint : Springer

Published

1990

Language

EN

ISBN

9781475799590

Category

engineering

Subjects

Engineering, Electrical, Stem

Updated

2026-03-25