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About this Engineering article
Optical Studies of Infrared Active Defects in Irradiated Si After Annealing at 450°C by Shi, Y.; Suezawa, Masashi; Wu, Feng Mei; Imai, M.; Zheng, Y.D.; Sumino, Koji is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Shi, Y.; Suezawa, Masashi; Wu, Feng Mei; Imai, M.; Zheng, Y.D.; Sumino, Koji
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd. (ISSN 1662-9752)
- Published
- 1995
- Field
- Engineering (Physical Sciences)
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