Skip to content

Opening book details…

About this scholarly article

2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) - Self-organized mapping of failure modes in portable electronics subjected to drop and shock by Lall, Pradeep; Gupta, Prashant; Panchagade, Dhananjay is a scholarly article available to read on EtoBox.

Author
Lall, Pradeep; Gupta, Prashant; Panchagade, Dhananjay
Publisher
IEEE
Published
2010
Language
EN

More by Lall, Pradeep; Gupta, Prashant; Panchagade, Dhananjay

Browse all works by Lall, Pradeep; Gupta, Prashant; Panchagade, Dhananjay