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Characteristic parameters for CPWs on a very thin dielectric layer by Ji-Xiang Zhao is a Engineering article available to read on EtoBox.
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## Abstract In this paper, approximate analytical expressions for characteristic parameters of CPWs on a very thin dielectric layer are given. The “crowding phenomenon” that occurs during the process of conformal mapping is overcome. Combining these expressions with the partial‐capacitance method, the characteristic parameters for CPWs on a multidielectric layered substrate are computed and are found to agree well with the test data. © 2005 Wiley Periodicals, Inc. Microwave Opt Technol Lett 45: 240–241, 2005; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20783
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- Author
- Ji-Xiang Zhao
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley (ISSN 0895-2477)
- Published
- 2005
- Language
- EN
- Field
- Engineering (Physical Sciences)