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An improved measurement of the 2\nu \beta \beta\ half-life of Xe-136 with EXO-200 by Albert, J. B.; Auger, M.; Auty, D. J.; Barbeau, P. S.; Beauchamp, E.; Beck, D.; Belov, V.; Benitez-Medina, C.; Bonatt, J.; Breidenbach, M.; Brunner, T.; Burenkov, A.; Cao, G. F.; Chambers, C.; Chaves, J.; Cleveland, B.; Cook, S.; Daniels, T.; Danilov, M.; Daugherty, S. J.; Davis, C. G.; Davis, J.; Delaquis, S.; DeVoe, R.; Dobi, A.; Dolinski, M. J.; Dolgolenko, A.; Dunford, M.; Fairbank, W.; Farine, J.; Feldmeier, W.; Fierlinger, P.; Franco, D.; Fudenberg, D.; Giroux, G.; Gornea, R.; Graham, K.; Gratta, G.; Hall, C.; Hall, K.; Hargrove, C.; Herrin, S.; Hughes, M.; Jiang, X. S.; Johnson, A.; Johnson, T. N.; Johnston, S.; Karelin, A.; Kaufman, L. J.; Killick, R.; Kravitz, S.; Kuchenkov, A.; Kumar, K. S.; Leonard, D. S.; Leonard, F.; Licciardi, C.; MacLellan, R.; Marino, M. G.; Mong, B.; Díez, M. Montero; Moore, D.; Nelson, R.; Odian, A.; Ostrovskiy, I.; O'Sullivan, K.; Ouellet, C.; Piepke, A.; Pocar, A.; Prescott, C. Y.; Rivas, A.; Rowson, P. C.; Rozo, M. P.; Russell, J. J.; Sabourov, A.; Sinclair, D.; Skarpaas, K.; Slutsky, S.; Stekhanov, V.; Strickland, V.; Tarka, M.; Tolba, T.; Tosi, D.; Twelker, K.; Vogel, P.; Vuilleumier, J. -L.; Waite, A.; Walton, J.; Walton, T.; Weber, M.; Wen, L. J.; Wichoski, U.; Wodin, J.; Wright, J. D.; Yang, L.; Yen, Y. -R.; Zeldovich, O. Ya.; Zhao, Y. B. is a scholarly article available to read on EtoBox.

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We report on an improved measurement of the 2\nu \beta \beta\ half-life of Xe-136 performed by EXO-200. The use of a large and homogeneous time projection chamber allows for the precise estimate of the fiducial mass used for the measurement, resulting in a small systematic uncertainty. We also discuss in detail the data analysis methods used for double-beta decay searches with EXO-200, while emphasizing those directly related to the present measurement. The Xe-136 2\nu \beta \beta\ half-life is found to be 2.165 +- 0.016 (stat) +- 0.059 (sys) x 10^21 years. This is the most precisely measured half-life of any 2\nu \beta \beta\ decay to date.

Author

Albert, J. B.; Auger, M.; Auty, D. J.; Barbeau, P. S.; Beauchamp, E.; Beck, D.; Belov, V.; Benitez-Medina, C.; Bonatt, J.; Breidenbach, M.; Brunner, T.; Burenkov, A.; Cao, G. F.; Chambers, C.; Chaves, J.; Cleveland, B.; Cook, S.; Daniels, T.; Danilov, M.; Daugherty, S. J.; Davis, C. G.; Davis, J.; Delaquis, S.; DeVoe, R.; Dobi, A.; Dolinski, M. J.; Dolgolenko, A.; Dunford, M.; Fairbank, W.; Farine, J.; Feldmeier, W.; Fierlinger, P.; Franco, D.; Fudenberg, D.; Giroux, G.; Gornea, R.; Graham, K.; Gratta, G.; Hall, C.; Hall, K.; Hargrove, C.; Herrin, S.; Hughes, M.; Jiang, X. S.; Johnson, A.; Johnson, T. N.; Johnston, S.; Karelin, A.; Kaufman, L. J.; Killick, R.; Kravitz, S.; Kuchenkov, A.; Kumar, K. S.; Leonard, D. S.; Leonard, F.; Licciardi, C.; MacLellan, R.; Marino, M. G.; Mong, B.; Díez, M. Montero; Moore, D.; Nelson, R.; Odian, A.; Ostrovskiy, I.; O'Sullivan, K.; Ouellet, C.; Piepke, A.; Pocar, A.; Prescott, C. Y.; Rivas, A.; Rowson, P. C.; Rozo, M. P.; Russell, J. J.; Sabourov, A.; Sinclair, D.; Skarpaas, K.; Slutsky, S.; Stekhanov, V.; Strickland, V.; Tarka, M.; Tolba, T.; Tosi, D.; Twelker, K.; Vogel, P.; Vuilleumier, J. -L.; Waite, A.; Walton, J.; Walton, T.; Weber, M.; Wen, L. J.; Wichoski, U.; Wodin, J.; Wright, J. D.; Yang, L.; Yen, Y. -R.; Zeldovich, O. Ya.; Zhao, Y. B.

Published

2013

Language

EN