Opening book details…
About this Engineering article
Source Reconstruction for IC Radiated Emissions Based on Magnitude-Only Near-Field Scanning by Zhang, Ji; Fan, Jun is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Zhang, Ji; Fan, Jun
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9375)
- Published
- 2017
- Language
- EN
- Field
- Engineering (Physical Sciences)