About this document
10.3 Diagnosis DynamicCE by vinaykumar124816 is a document available to read on EtoBox.
The document discusses Dynamic Cause-effect diagnosis in VLSI testing, outlining a procedure that includes testing the Circuit Under Diagnosis (CUD) and selecting candidate faults for simulation. It details three key steps: Structural backtracing, Parity check, and Excitation condition check, which help generate a partial fault dictionary, thus saving storage space. The approach is emphasized as being very useful in practical applications.
- Author
- vinaykumar124816
- Language
- EN