Skip to content

Opening book details…

About this Engineering article

Digital Shifting Photoelasticity with Optical Enlarged Unwrapping Technology for Local Stress Measurement by Xue-Feng Yao; Long-Hui Jian; Wei Xu; Guan-Chang Jin; Hsien-Yang Yeh is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Xue-Feng Yao; Long-Hui Jian; Wei Xu; Guan-Chang Jin; Hsien-Yang Yeh
Publisher
Elsevier Science; Elsevier ; Elsevier BV (ISSN 0030-3992)
Published
2005
Language
EN
Field
Engineering (Physical Sciences)

More by Xue-Feng Yao; Long-Hui Jian; Wei Xu; Guan-Chang Jin; Hsien-Yang Yeh

Browse all works by Xue-Feng Yao; Long-Hui Jian; Wei Xu; Guan-Chang Jin; Hsien-Yang Yeh