About this scholarly article

SPIE Proceedings [SPIE Photonics Asia 2002 - Shanghai, China (Monday 14 October 2002)] Optical Design and Testing - Reflecting optical system to increase signal intensity in confocal microscopy by Kang, Dong Kyun; Seo, Jungwoo; Gweon, Dae gab; Weng, Zhicheng; Sasian, Jose M.; Wang, Yongtian is a scholarly article available to read on EtoBox.

Author

Kang, Dong Kyun; Seo, Jungwoo; Gweon, Dae gab; Weng, Zhicheng; Sasian, Jose M.; Wang, Yongtian

Publisher

SPIE

Published

2002

Language

EN