About this scholarly article

Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548) - Generation of hole traps in silicon dioxides by Zhang, J.F.; Sii, H.K.; Groeseneken, G.; Degraeve, R. is a scholarly article available to read on EtoBox.

Author

Zhang, J.F.; Sii, H.K.; Groeseneken, G.; Degraeve, R.

Publisher

IEEE

Published

2001