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About this Engineering article
RF characterization of Josephson flux-flow transistors: design, modeling, and on-wafer measurement by Zhang, Y.M.; Carlsson, E.; Winkler, D.; Brorsson, G.; Zirath, H.; Wikborg, E. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Zhang, Y.M.; Carlsson, E.; Winkler, D.; Brorsson, G.; Zirath, H.; Wikborg, E.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1051-8223)
- Published
- 1995
- Language
- EN
- Field
- Engineering (Physical Sciences)
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