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About this Engineering article
2005 8th European Conference on Radiation and Its Effects on Components and Systems - Inactivity Windows and Leakage Currents in Irradiated CMOS Analog Switches by Franco, F. J.; Zong, Y.; Agapito, J. A. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Franco, F. J.; Zong, Y.; Agapito, J. A.
- Publisher
- IEEE
- Published
- 2005
- Language
- EN
- Field
- Engineering (Physical Sciences)