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About this Engineering article
Synchrotron high energy X-ray diffraction study of microstructure evolution of severely cold drawn NiTi wire during annealing by Yu, Cun; Aoun, Bachir; Cui, Lishan; Liu, Yinong; Yang, Hong; Jiang, Xiaohua; Cai, Song; Jiang, Daqiang; Liu, Zunping; Brown, Dennis E.; Ren, Yang is a Engineering article available to read on EtoBox.
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- Author
- Yu, Cun; Aoun, Bachir; Cui, Lishan; Liu, Yinong; Yang, Hong; Jiang, Xiaohua; Cai, Song; Jiang, Daqiang; Liu, Zunping; Brown, Dennis E.; Ren, Yang
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 1359-6454)
- Published
- 2016
- Language
- EN
- Field
- Engineering (Physical Sciences)