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About this Engineering article
Single Event Effects in High Density CMOS SRAMs by Shiono, Noboru; Sakagawa, Yoshimitsu; Sekiguchi, Masayuki; Sato, Kenji; Sugai, Isao; Hattori, Toshiyuki; Hirao, Yasuo is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Shiono, Noboru; Sakagawa, Yoshimitsu; Sekiguchi, Masayuki; Sato, Kenji; Sugai, Isao; Hattori, Toshiyuki; Hirao, Yasuo
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)
- Published
- 1986
- Language
- EN
- Field
- Engineering (Physical Sciences)