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About this Engineering article

The Application of Statistical Pattern Recognition Methods for Damage Detection to Field Data by Cheung, A; Cabrera, C; Sarabandi, P; Nair, K K; Kiremidjian, A; Wenzel, H is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Cheung, A; Cabrera, C; Sarabandi, P; Nair, K K; Kiremidjian, A; Wenzel, H
Publisher
Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0964-1726)
Published
2008
Language
EN
Field
Engineering (Physical Sciences)

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