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About this Engineering article
The Application of Statistical Pattern Recognition Methods for Damage Detection to Field Data by Cheung, A; Cabrera, C; Sarabandi, P; Nair, K K; Kiremidjian, A; Wenzel, H is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Cheung, A; Cabrera, C; Sarabandi, P; Nair, K K; Kiremidjian, A; Wenzel, H
- Publisher
- Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0964-1726)
- Published
- 2008
- Language
- EN
- Field
- Engineering (Physical Sciences)
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