About this scholarly article

SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 31 January 1993)] Machine Vision Applications in Industrial Inspection - Registration error measurements with coherent optical processors by Cai, Xian-Yang; Kvasnik, Frank; Blore, Roy W.; Wu, Frederick Y.; Dawson, Benjamin M. is a scholarly article available to read on EtoBox.

Author

Cai, Xian-Yang; Kvasnik, Frank; Blore, Roy W.; Wu, Frederick Y.; Dawson, Benjamin M.

Publisher

SPIE

Published

1993