About this scholarly article

2012 7th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) - Reliability prediction of 3C-SiC cantilever beams using dynamic Raman spectroscopy by Dewanto, Raden; Chen, Tao; Cheung, Rebecca; Hu, Zhongxu; Gallacher, Barry; Hedley, John is a scholarly article available to read on EtoBox.

Author

Dewanto, Raden; Chen, Tao; Cheung, Rebecca; Hu, Zhongxu; Gallacher, Barry; Hedley, John

Publisher

IEEE

Published

2012