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About this Engineering article
On-wafer Electrooptic Probing Using Rotational Deformation Modulation by Chen, W.H.; Kuo, W.K.; Huang, S.L.; Huang, Y.T. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Chen, W.H.; Kuo, W.K.; Huang, S.L.; Huang, Y.T.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1041-1135)
- Published
- 2000
- Field
- Engineering (Physical Sciences)