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About this Engineering article
Combining strong interface recombination with bandgap narrowing and short diffusion length in Cu2ZnSnS4 device modeling by Frisk, C.; Ericson, T.; Li, S.-Y.; Szaniawski, P.; Olsson, J.; Platzer-Björkman, C. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Frisk, C.; Ericson, T.; Li, S.-Y.; Szaniawski, P.; Olsson, J.; Platzer-Björkman, C.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0927-0248)
- Published
- 2016
- Language
- EN
- Field
- Engineering (Physical Sciences)