Opening book details…
Can I read Electrical Techniques for the Measurement of Deep States on EtoBox?
Electrical Techniques for the Measurement of Deep States by A.R. Peaker; M.R. Brozel is a Engineering article available to read on EtoBox.
What is Electrical Techniques for the Measurement of Deep States about?
When point defects, either intrinsic (such as vacanties or interstitials) or extrinsic (most impurities with the exception of shallow donors or acceptors) are introduced into a semiconductor, they can result in the occurrence of 'deep states'. These are electronic levels that are not normally ionized at room temperature, but can affect both carrier concentrations and minority carrier lifetime. The purpose of this review is to provide an outline of the techniques that are commonly used to characterize deep defect states in terms of their 1 electrical properties.
Who reads Electrical Techniques for the Measurement of Deep States?
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- A.R. Peaker; M.R. Brozel
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0961-1290)
- Published
- 1999
- Language
- EN
- Field
- Engineering (Physical Sciences)