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ToF-SIMS Analysis of Glass Corrosion by erhunohanmu is a document available to read on EtoBox.
What is ToF-SIMS Analysis of Glass Corrosion about?
This study investigates the capabilities and limitations of time-of-flight secondary ion mass spectrometry (ToF-SIMS) for analyzing the chemical processes of glass corrosion, specifically focusing on alteration layers formed on International Simple Glass. The research highlights the impact of the ToF-SIMS ion beam on the distribution of elements such as lithium, sodium, and potassium, while observing no significant effects on oxygen and hydrogen. The findings indicate that uncertainties remain regarding ele
- Author
- erhunohanmu
- Language
- EN