Opening book details…
About this Materials Science article
Lateral redistribution of trapped charges in nitride/oxide/Si (NOS) investigated by electrostatic force microscopy by Baik, Seung Jae; Lim, Koeng Su; Choi, Wonsup; Yoo, Hyunjun; Lee, Jang-Sik; Shin, Hyunjung is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Baik, Seung Jae; Lim, Koeng Su; Choi, Wonsup; Yoo, Hyunjun; Lee, Jang-Sik; Shin, Hyunjung
- Publisher
- The Royal Society of Chemistry; Royal Society of Chemistry; Royal Society of Chemistry (RSC) (ISSN 2040-3364)
- Published
- 2011
- Field
- Materials Science (Physical Sciences)