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About this Engineering article
Measurement of the Fracture Energy of SiO2/TiN Interfaces Using the Residually-Stressed Thin-Film Micro-Strip Test by Xu, Guanghai; Ragan, D. D.; Clarke, D. R.; He, Ming Y.; Ma, Qing; Fujimoto, H. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Xu, Guanghai; Ragan, D. D.; Clarke, D. R.; He, Ming Y.; Ma, Qing; Fujimoto, H.
- Publisher
- Cambridge University Press; Cambridge University Press (Materials Research Society); Cambridge University Press (CUP) (ISSN 0272-9172)
- Published
- 1996
- Language
- EN
- Field
- Engineering (Physical Sciences)
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