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About this Engineering article
Relation between bit and symbol error probabilities for DPSK and FSK with differential phase detection by Korn, I.; Hii, L.M. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Korn, I.; Hii, L.M.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0090-6778)
- Published
- 1994
- Language
- EN
- Field
- Engineering (Physical Sciences)