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About this Physics and Astronomy article
"X-Ray Diffraction Measurement of the Effect of Layer Thickness on the Ferroelectric Transition in EpitaxialKTaO3/KNbO3Multilayers" by Specht, E. D.; Christen, H.-M.; Norton, D. P.; Boatner, L. A. is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Specht, E. D.; Christen, H.-M.; Norton, D. P.; Boatner, L. A.
- Publisher
- The American Physical Society; American Physical Society; American Physical Society (APS) (ISSN 0031-9007)
- Published
- 1998
- Field
- Physics and Astronomy (Physical Sciences)
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