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This paper presents a comparative study of the performance and reliability of various 32-bit binary adder structures, focusing on carry propagate adders (CPAs) and parallel prefix adders (PPAs) under different voltage conditions. It examines the effects of process variation and negative bias temperature instability (NBTI) on adder performance metrics such as delay, power, energy, and energy-delay product (EDP). The findings suggest that while PPAs generally offer better merit factors across voltage ranges,

Author

manishsutradhar0

Language

EN