About this scholarly article

Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - New techniques for deterministic test pattern generation by Hamzaoglu, I.; Patel, J. H. is a scholarly article available to read on EtoBox.

Author

Hamzaoglu, I.; Patel, J. H.

Publisher

IEEE Comput. Soc

Published

1998