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2013 Saudi International Electronics, Communications and Photonics Conference - Variability-aware NoC geometry and topology scaling by Gawish, Eman Kamel; El-Kharashi, M. Watheq; Abu-Elyazeed, M. F. is a scholarly article available to read on EtoBox.

Author
Gawish, Eman Kamel; El-Kharashi, M. Watheq; Abu-Elyazeed, M. F.
Publisher
IEEE
Published
2013

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