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About this scholarly article
2015 23nd Signal Processing and Communications Applications Conference (SIU) - Matching day and night location images using SIFT and logistic regression by Tekin, Nazli; Peker, Kadir A. is a scholarly article available to read on EtoBox.
- Author
- Tekin, Nazli; Peker, Kadir A.
- Publisher
- IEEE
- Published
- 2015