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About this Engineering article
In Situ Formation, Reactions, and Electrical Characterization of Molecular Beam Epitaxy-grown Metal/semiconductor Interfaces by L. C. Chen; D. A. Caldwell; T. G. Finstad; C. J. Palmstro̸m is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- L. C. Chen; D. A. Caldwell; T. G. Finstad; C. J. Palmstro̸m
- Publisher
- AVS (American Vacuum Society); American Vacuum Society; American Institute of Physics (ISSN 0734-2101)
- Published
- 1999
- Language
- EN
- Field
- Engineering (Physical Sciences)
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