About this scholarly article

44th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference - Evaluation of Shear Compliant Borders for Wrinkle Reduction in Thin Film Membrane Structures by Leifer, Jack; Black, Jonathan; Belvin, W.; Behun, Vaughn is a scholarly article available to read on EtoBox.

Author

Leifer, Jack; Black, Jonathan; Belvin, W.; Behun, Vaughn

Publisher

American Institute of Aeronautics and Astronautics

Published

2003