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About this scholarly article
2004 IEEE International Reliability Physics Symposium. Proceedings - Acceleration factors and mechanistic study of progressive breakdown in small area ultra-thin gate oxides by Suehle, J.S.; Zhu, B.; Che, Y.; Bernstein, J.B. is a scholarly article available to read on EtoBox.
- Author
- Suehle, J.S.; Zhu, B.; Che, Y.; Bernstein, J.B.
- Publisher
- IEEE
- Published
- 2004
- Language
- EN
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