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About this Engineering article
Vertical smear noise model for MOS-type color imager by Ohba, S.; Nakai, M.; Ando, H.; Takahashi, K.; Masuda, M.; Takemoto, I.; Fujita, T. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Ohba, S.; Nakai, M.; Ando, H.; Takahashi, K.; Masuda, M.; Takemoto, I.; Fujita, T.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 1985
- Language
- EN
- Field
- Engineering (Physical Sciences)