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## Preface This proceedings volume contains a collection of papers presented at the "2nd Workshop on Development and Industrial Application of Scanning Probe Microscopy (SXM 2)Ï which was held on 16È18 September 1996 in Vienna, Austria. Following the Ðrst workshop held in October 1994 in Mu nster, Germany, the continued high interest in the SXM series was again documented by over 160 participants and 10 manufacturers who attended SXM 2. During the 3 days of the workshop, a total of 52 oral contributions and 30 posters were presented. Fifteen per cent of the contributions came from industry. Six invited lecturers reported on subjects such as scanning probe microscopy in semiconductor technology, STM on metals, true atomic resolution with AFM, scanning force microscopy of polymers, nanotribological investigations with scanning force microscopy and high resolution near-Ðeld optical microscopy. In general, the broad variety of topics is also documented by the contributed papers, including up-to-date instrumental developments from a variety of manufacturers. The very positive response we have received for SXM 2 can be seen as a clear vote for the continuation of this workshop series wit

Who reads Preface?

Author

Friedbacher, Gernot; Fuchs, Harold; Guntherodt, Hans-Joachim

Publisher

John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley; Research Square (ISSN 0142-2421)

Published

1997

Language

EN

Field

Engineering (Physical Sciences)