Opening book details…
Can I read Measurement Method of Physical Properties of Adsorbed Layers on EtoBox?
Measurement Method of Physical Properties of Adsorbed Layers by Kentaro Tanaka; Katsumi Iwamoto is a book available to read on EtoBox.
What is Measurement Method of Physical Properties of Adsorbed Layers about?
Lubrication by a molecularly thin film has become very important in micro machines, magnetic recording disks and so on. Molecularly thin film is considered a good lubricant for these micro devices. When, the thickness of the lubricant film is thinned to several nanometers, the tribological properties of the film become different from that of the bulk. Therefore it is important to know these properties. Quartz crystal microbalance (QCM) is common in thin film growth, where it is used for film thickness measurements. QCM allows one to evaluate the physical properties of viscous liquid layer on the quartz crystal surface. In this study, we investigated the effect of additives on the viscosity. When the additives formed the adsorbed layer on the quartz crystal, the decreases in the resonant frequency of the quartz crystal were observed. It is found that QCM can detect the properties of adsorbed layers.
- Author
- Kentaro Tanaka; Katsumi Iwamoto
- Publisher
- Elsevier
- Published
- 2005
- Language
- EN
More by Kentaro Tanaka; Katsumi Iwamoto
Browse all works by Kentaro Tanaka; Katsumi Iwamoto
Similar books
- Physical Vapor Deposition of Thin Films — John E. Mahan (2000)
- Zinc Oxide: The Versatile Material with an Assortment of Physical Properties — E. Senthil Kumar; Shubra Singh; M. S. Ramachandra Rao (2013)
- Physical Properties
- Physical Properties — Carl L. Yaws (1997)
- Measurement of physical properties / Part 1., Some special properties / authors ... D.P. De Witt — Rointan F Bunshah; Elio Passaglia; D. P De Witt (1972)
- Physical Properties — Charles R. Fitts (2024)