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About this Engineering article
Study on the Effects of Post-Deposition Annealing on SiO2/β-Ga2O3 MOS Characteristics by Kita, Koji; Suzuki, Eiki; Mao, Qin is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kita, Koji; Suzuki, Eiki; Mao, Qin
- Publisher
- The Electrochemical Society; Electrochemical Society, Inc. (ISSN 1938-6737)
- Published
- 2019
- Field
- Engineering (Physical Sciences)