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About this Engineering article
A Comparison between SiO2/4H-SiC Interface Traps on (0001) and (11-20) Faces by Ólafsson, H.Ö.; Hallin, Christer; Sveinbjörnsson, Einar Ö. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Ólafsson, H.Ö.; Hallin, Christer; Sveinbjörnsson, Einar Ö.
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd. (ISSN 1662-9752)
- Published
- 2004
- Field
- Engineering (Physical Sciences)
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