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About this nonfiction
Accurate linewidth measurements on integrated-circuit photomasks by John M Jerke; Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division; United States Defense Advanced Research Projects Agency; United States National Bureau of Standards is a nonfiction available to read on EtoBox.
It is typically read by self-directed learners exploring a subject in depth.
Common subject areas: history, science, philosophy, social sciences.
- Author
- John M Jerke; Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division; United States Defense Advanced Research Projects Agency; United States National Bureau of Standards
- Publisher
- U.S. Dept. of Commerce, National Bureau of Standards : U.S. Govt. Print. Off. : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1980.
- Published
- 1980
- Language
- EN
- Category
- nonfiction
More by John M Jerke; Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division; United States Defense Advanced Research Projects Agency; United States National Bureau of Standards
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