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About this Materials Science article
Electrical Characteristic Analysis Using Low-Frequency Noise in Low-Temperature Polysilicon Thin Film Transistors by Kim, Y. M. (author);Jeong, K. S. (author);Yun, H. J. (author);Yang, S. D. (author);Lee, S. Y. (author);Kim, M. J. (author);Kwon, O. S. (author);Jeong, C. W. (author);Kim, J. Y. (author);Kim, S. C. (author);Lee, G. W. (author) is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Kim, Y. M. (author);Jeong, K. S. (author);Yun, H. J. (author);Yang, S. D. (author);Lee, S. Y. (author);Kim, M. J. (author);Kwon, O. S. (author);Jeong, C. W. (author);Kim, J. Y. (author);Kim, S. C. (author);Lee, G. W. (author)
- Publisher
- American Scientific Publishers (ISSN 1533-4880)
- Published
- 2012
- Field
- Materials Science (Physical Sciences)