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About this Engineering article
X-ray Radiation Damage of Organic Semiconductor Thin Films During Grazing Incidence Diffraction Experiments by A. Neuhold; J. Novák; H.-G. Flesch; A. Moser; T. Djuric; L. Grodd; S. Grigorian; U. Pietsch; R. Resel is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- A. Neuhold; J. Novák; H.-G. Flesch; A. Moser; T. Djuric; L. Grodd; S. Grigorian; U. Pietsch; R. Resel
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0168-583X)
- Published
- 2012
- Language
- EN
- Field
- Engineering (Physical Sciences)