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About this Engineering article
Characterization and modeling of drain current local variability in 28 and 14nm FDSOI nMOSFETs by Ioannidis, E.G.; Haendler, S.; Josse, E.; Planes, N.; Ghibaudo, G. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Ioannidis, E.G.; Haendler, S.; Josse, E.; Planes, N.; Ghibaudo, G.
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0038-1101)
- Published
- 2016
- Field
- Engineering (Physical Sciences)
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