Opening book details…
About this Engineering article
Accuracy and Issues of the Spectroscopic Analysis of RTN Traps in Nanoscale MOSFETs by Adamu-Lema, Fikru; Monzio Compagnoni, Christian; Amoroso, Salvatore M.; Castellani, Niccolò; Gerrer, Louis; Markov, Stanislav; Spinelli, Alessandro S.; Lacaita, Andrea L.; Asenov, Asen is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Adamu-Lema, Fikru; Monzio Compagnoni, Christian; Amoroso, Salvatore M.; Castellani, Niccolò; Gerrer, Louis; Markov, Stanislav; Spinelli, Alessandro S.; Lacaita, Andrea L.; Asenov, Asen
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 2013
- Language
- EN
- Field
- Engineering (Physical Sciences)