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Can I read Scanning Electron Microscope Magnifies Further on EtoBox?
Scanning Electron Microscope Magnifies Further is a Engineering article available to read on EtoBox.
What is Scanning Electron Microscope Magnifies Further about?
## Software for stress analysis PANalytical's X'Pert Stress Plus 2.0 software package enables the analysis of residual stresses in amorphous substrates, polycrystalline coatings, or single crystals. The new software is part of a package that includes PANalytical's X'Pert PRO hardware platform and the stress measurement software, X'Pert Data Collector 2.2. Examples of applications include analysis of TiC on steel, TiAlN coatings on tool inserts, surface stresses in ceramics, and oxide coatings on glass. X'Pert Stress Plus 2.0 supports data for grazing incidence measurements and multiple peak analysis.
Who reads Scanning Electron Microscope Magnifies Further?
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 1369-7021)
- Published
- 2007
- Language
- EN
- Field
- Engineering (Physical Sciences)