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Hong-Ou-Mandel Interferometry and Quantum Metrology With Multimode Frequency-Bin Entangled Photons by das25hrishit is a document available to read on EtoBox.
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This research article discusses the generation and application of multimode frequency-bin entangled photons using a semiconductor chip, focusing on Hong–Ou–Mandel (HOM) interferometry and its implications for quantum metrology. The authors present a model for HOM interference with multimode entangled states and demonstrate high-visibility interference patterns, emphasizing the relationship between mode characteristics and measurement precision. The findings aim to enhance understanding of multimode entangle
- Author
- das25hrishit
- Language
- EN