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About this scholarly article
24th IEEE VLSI Test Symposium - A Scheme for On-Chip Timing Characterization by Datta, R.; Carpenter, G.; Nowka, K.; Abraham, J.A. is a scholarly article available to read on EtoBox.
- Author
- Datta, R.; Carpenter, G.; Nowka, K.; Abraham, J.A.
- Publisher
- IEEE
- Published
- 2006
- Language
- EN
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