About this scholarly article

Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) - Optimizing HW/SW codesign towards reliability for critical-application systems by Vargas, F.; Bezerra, E.; Wulff, L.; Barros, D. is a scholarly article available to read on EtoBox.

Author

Vargas, F.; Bezerra, E.; Wulff, L.; Barros, D.

Publisher

IEEE Comput. Soc

Published

1998

Language

EN